Residual stress in particulate epoxy resin by X-ray diffraction

Autor:	Takeshi Matsumoto, Takashi Nishino, Xu Airu, Kanki Matsumoto, Katsuhiko Nakamae
Rok vydání:	1992
Předmět:	Materials science Polymers and Plastics Modulus General Chemistry Epoxy Thermal expansion Surfaces Coatings and Films Crystal Compressive strength Residual stress visual_art Volume fraction X-ray crystallography Materials Chemistry visual_art.visual_art_medium Composite material
Zdroj:	Journal of Applied Polymer Science. 45:1239-1244
ISSN:	1097-4628 0021-8995
DOI:	10.1002/app.1992.070450713
Popis:	Residual stress in particulate epoxy resin was investigated by X-ray diffraction. Microdeformation of incorporated Al and α-SiO2 crystal, which was induced by the residual stress, could be detected as a shift of X-ray diffraction peak. The residual stress at the interface between the adherend and the particulate epoxy resin was found to decrease with the increase of volume fraction of filler. It was shown that the difference in the thermal expansion coefficients between the adherend and the particulate epoxy resin is much more effective on residual stress than the increment of Young's modulus owing to the incorporation of filler. When epoxy resin was cured on the Al plate, incorporated particles were subjected to a tensile stress; while cured on polytetrafluoroethylene sheet, particles were subjected to a compressive stress. The incorporation of some inorganic particles is considered effective to reduce the residual stress.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::a3fc1b0afcf09422cc1a3c716a174771 https://doi.org/10.1002/app.1992.070450713 Zobrazit plný text záznamu Plný text