SURFACE BREAKDOWN OF SILICON p/sup +/-n/sup -/-n/sup +/ AND n/sup +/-n/sup -/-n/sup +/ STRUCTURES

Autor:	B.J. Hankla, P. F. Williams, R.A. Peterson, A. Raghavendran, F. E. Peterkin
Rok vydání:	2005
Předmět:	Materials science Dielectric strength Silicon business.industry Surface breakdown chemistry.chemical_element Semiconductor device law.invention Gallium arsenide chemistry.chemical_compound chemistry law Arc flash Optoelectronics Resistor business Voltage
Zdroj:	Ninth IEEE International Pulsed Power Conference.
DOI:	10.1109/ppc.1993.514010
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::a3faff2c6979196f6140978209ab767a https://doi.org/10.1109/ppc.1993.514010 Zobrazit plný text záznamu