High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST
Autor: | Keno Sato, Takayuki Nakatani, Shogo Katayama, Daisuke Iimori, Gaku Ogihara, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Yujie Zhao, Kentaroh Katoh, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi |
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Rok vydání: | 2022 |
Zdroj: | 2022 IEEE 31st Asian Test Symposium (ATS). |
DOI: | 10.1109/ats56056.2022.00019 |
Databáze: | OpenAIRE |
Externí odkaz: |