Potential model and simulation analysis of dual material gate vertical TFET with impact of interface trap charges

Autor:	K. Kalai Selvi, K.S. Dhanalakshmi, R. Anusha Padmavathi
Rok vydání:	2022
Předmět:	Biomaterials Condensed Matter Physics Electronic Optical and Magnetic Materials
Zdroj:	Micro and Nanostructures. 172:207443
ISSN:	2773-0123
DOI:	10.1016/j.micrna.2022.207443
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::a399fe14630dba05eff25d6838fcc138 https://doi.org/10.1016/j.micrna.2022.207443 Zobrazit plný text záznamu Full Text from ScienceDirect