The number of measurements of a surface’s topography and the expected variation in adhesion to the surface
| Autor: | Jennifer L. Evans, Jordan M. N. Thorpe, Myles C. Thomas, Stephen P. Beaudoin, Maggie J. Cassidy, Sean G. Fronczak |
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| Rok vydání: | 2018 |
| Předmět: |
Materials science
Atomic force microscopy 02 engineering and technology Surfaces and Interfaces General Chemistry Surface finish 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences Quantitative Biology::Cell Behavior 0104 chemical sciences Surfaces Coatings and Films symbols.namesake Mechanics of Materials Rough surface Materials Chemistry symbols Adhesion force Particle adhesion van der Waals force Composite material 0210 nano-technology Nanoscopic scale |
| Zdroj: | Journal of Adhesion Science and Technology. 32:2099-2110 |
| ISSN: | 1568-5616 0169-4243 |
| DOI: | 10.1080/01694243.2018.1461446 |
| Popis: | Variations in roughness on a surface spawn variations in adhesion force between the surface and any particles that contact the surface. To fully characterize the adhesion that will be exhibited when a particle contacts any location on the surface, it is desirable to map the surface with nanoscale detail. Since it is impractical to make nanoscale roughness measurements over the entirety of a surface with a characteristic dimension on the order of centimeters, a relationship between the number of surface measurements and the likely variation in the expected adhesion force is similarly desirable. In this work, the predicted van der Waals force was used to describe the particle adhesion force. The bootstrap statistical method was employed to estimate the error associated with the predicted mean adhesion force between a smooth spherical particle and a rough surface as a function of the number of locations on the surface where the roughness was measured. Specifically, 40 atomic force microscope (AFM) to... |
| Databáze: | OpenAIRE |
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