Analysis of channel breakdown phenomenon in HFETs by a quasi-two-dimensional simulation

Autor:	J.C. De Jaeger, Y. Butel, J. Hedoire
Rok vydání:	1998
Předmět:	Engineering business.industry Electronic engineering Electrical engineering Dimensional simulation Electrical and Electronic Engineering Condensed Matter Physics business Atomic and Molecular Physics and Optics Breakdown phenomenon Electronic Optical and Magnetic Materials Communication channel
Zdroj:	Microwave and Optical Technology Letters. 18:6-14
ISSN:	1098-2760 0895-2477
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::a39018fe9a71433c32490b40a446d01a https://doi.org/10.1002/(sici)1098-2760(199805)18:1<6::aid-mop3>3.0.co Zobrazit plný text záznamu Plný text