| Autor: |
Bibhuti Bhusan Jena, Krishnakumar S. R. Menon, Arunava Kar, Smruti Ranjan Mohanty |
| Rok vydání: |
2020 |
| Předmět: |
|
| Zdroj: |
DAE SOLID STATE PHYSICS SYMPOSIUM 2019. |
| ISSN: |
0094-243X |
| DOI: |
10.1063/5.0017498 |
| Popis: |
Antiferromagnetic (AFM) CoO/NiO thin films are grown epitaxially on MgO(001) substrate and investigated by x-ray linear dichroism (XLD). Temperature-dependent measurement confirms that the observed XLD effect in this system originates entirely from the magnetic ordering. The temperature-dependent XMLD measurement indicates that the exchange coupling at the CoO/NiO interface can greatly enhance the Neeltemperature of the CoO layer. The XASof NiL2 edge shows the spin of the NiO in the system is in-plane. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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