Sensitivity of FET parasitic elements extraction due to uncertainty on TRM calibration structures

Autor:	J. Apolinar Reynoso-Hernandez, M. A. Pulido-Gaytan, M. C. Maya-Sanchez, José Raúl Loo-Yau
Rok vydání:	2021
Předmět:	Physics business.industry Calibration (statistics) Extraction (chemistry) Optoelectronics Field-effect transistor Sensitivity (control systems) Electrical and Electronic Engineering business Computer Graphics and Computer-Aided Design Computer Science Applications
Zdroj:	International Journal of RF and Microwave Computer-Aided Engineering. 31
ISSN:	1099-047X 1096-4290
DOI:	10.1002/mmce.22889
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::a2fcdd64f170ef92395d45af26627b4b https://doi.org/10.1002/mmce.22889 Zobrazit plný text záznamu