Isomorphic contact resonance force microscopy and piezoresponse force microscopy of an AlN thin film: demonstration of a new contact resonance technique
| Autor: | Lawrence H. Robins, Ryan C. Tung, Jason P. Killgore, Matthew D. Brubaker |
|---|---|
| Rok vydání: | 2020 |
| Předmět: |
Materials science
business.industry Atomic force microscopy Biomedical Engineering Resonance Bioengineering General Chemistry Atomic and Molecular Physics and Optics Piezoelectric thin films Piezoresponse force microscopy Microscopy Optoelectronics General Materials Science Electrical and Electronic Engineering Thin film business |
| Zdroj: | Nano Futures. 4:025003 |
| ISSN: | 2399-1984 |
| DOI: | 10.1088/2399-1984/ab844f |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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