Extended Data Retention Characteristics after More than 104 Write and Erase Cycles in Eeproms

Autor:	S. Aritome, R. Kirisawa, T. Endoh, R. Nakayama, R. Shirota, K. Sakui, K. Ohuchi, F. Masuoka
Rok vydání:	1990
Zdroj:	28th International Reliability Physics Symposium.
ISSN:	0735-0791
DOI:	10.1109/irps.1990.363530
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::a2db896613e641d2a3d4f408bbd9e19c https://doi.org/10.1109/irps.1990.363530 Zobrazit plný text záznamu