The Surface Kinetics of MBE-Grown CdTe (211)B During In Situ Cyclic Annealing
| Autor: | J. K. Markunas, Joseph G. Pellegrino, J. D. Benson, R. N. Jacobs, C. M. Lennon, P. J. Smith, L. A. Almeida, J. Arias |
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| Rok vydání: | 2013 |
| Předmět: |
Materials science
Solid-state physics Annealing (metallurgy) Kinetics Analytical chemistry Activation energy Condensed Matter Physics Cadmium telluride photovoltaics Electronic Optical and Magnetic Materials Electron diffraction Materials Chemistry Sublimation (phase transition) Electrical and Electronic Engineering Molecular beam epitaxy |
| Zdroj: | Journal of Electronic Materials. 42:3344-3348 |
| ISSN: | 1543-186X 0361-5235 |
| Popis: | The surface kinetics of CdTe (211)B grown by molecular beam epitaxy (MBE) is investigated using spectroscopic ellipsometry (SE) during in situ cyclic annealing. A method of measuring sublimation rates from high-index surfaces without use of reflection high-energy electron diffraction is presented. The effect of Te2 overpressure on the activation energy of sublimation for the CdTe (211)B surface is reported. The sensitivity of SE to surface temperature and film thickness was leveraged to monitor sublimation rates of CdTe stabilized by a Te2 overpressure. The sublimation activation energy was found to increase from 0.45 eV to 2.94 eV under the Te2 beam pressure regime investigated. |
| Databáze: | OpenAIRE |
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