Characterization of CdTe and CdS Films for Photoresistors
| Autor: | B. A. Ergashev, Sh. A. Esanov, A. Yu. Usmonov, Alessio Bosio, Nicola Romeo, Abdurashid Mavlonov, T. M. Razykov |
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| Rok vydání: | 2019 |
| Předmět: |
Morphology (linguistics)
Materials science Renewable Energy Sustainability and the Environment Photoresistor Substrate (electronics) Cadmium telluride photovoltaics law.invention Condensed Matter::Materials Science Chemical engineering law Condensed Matter::Superconductivity Deposition (phase transition) Crystallite Growth rate Thin film |
| Zdroj: | Applied Solar Energy. 55:1-4 |
| ISSN: | 1934-9424 0003-701X |
| DOI: | 10.3103/s0003701x19010110 |
| Popis: | Dependences of the evaporation temperature and the growth rate on minimal condensation temperature of polycrystalline CdS films in chemical molecular-beam deposition are discussed. The effect of the evaporation rate and the substrate temperature on the morphology of films has been studied. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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