High Resolution Polymer Imaging Using Scanning Electron Microscopy With Back Scattered Electron Detector

Autor: Tocha, Ewa, Bar, Georg
Rok vydání: 2009
DOI: 10.3217/978-3-85125-062-6-557
Popis: Mc 2009. Microscopy Conference, Graz, Austria. 30 August - 4 September 2009. First Joint Meeting Of Dreiländertagung And Multinational Congress On Microscopy.
Databáze: OpenAIRE