43- and 50-Mp High-Performance Interline CCD Image Sensors
| Autor: | Eric G. Stevens, Ryan Kather, Joseph Summa, Peter Mersich, John McCarten, James E. Doran, Douglas A. Carpenter, Shen Wang, Eric J. Meisenzahl, Robert P. Fabinski, Tom Frank, Stephen L. Kosman, Brian Tobey, Cristian Tivarus, Richard Brolly, Alden Lum, Adam DeJager |
|---|---|
| Rok vydání: | 2019 |
| Předmět: |
010302 applied physics
Pixel business.industry Machine vision Image quality Computer science ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION Electrical engineering Large format 01 natural sciences Aspect ratio (image) Electronic Optical and Magnetic Materials Optical format 0103 physical sciences Electrical and Electronic Engineering Image sensor business Image resolution |
| Zdroj: | IEEE Transactions on Electron Devices. 66:1329-1337 |
| ISSN: | 1557-9646 0018-9383 |
| DOI: | 10.1109/ted.2019.2891414 |
| Popis: | This paper describes the design and performance of two new high-resolution interline charge-coupled device image sensors for use in industrial, machine vision, and aerial photography applications. These sensors feature 4.5- $\mu \text{m}$ pixels, 4 outputs, fast dump gate, horizontal lateral overflow drain, and vertical electronic shutter. The 43-Mp sensor has a 35-mm optical format and the 50-Mp sensor has a larger format with a 2.175:1 aspect ratio that matches many modern mobile phone displays. This paper discusses the challenges and solutions to manufacture such large sensors with superior image quality such as uniformity, read noise, dark current, smear, transfer gate blooming, lag, and so on. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|