Some characteristics in the interaction of slow highly charged Iq+ ions with a Si(111) 1×1-H surface

Autor:	Nobuo Yoshiyasu, Kazuo Nagata, Shunsuke Ohtani, Makoto Sakurai, Nobuyuki Nakamura, Satoshi Takahashi, Masahide Tona, Chikashi Yamada
Rok vydání:	2006
Předmět:	Range (particle radiation) Hydrogen Chemistry Analytical chemistry Highly charged ion chemistry.chemical_element Surfaces and Interfaces Condensed Matter Physics Spectral line Surfaces Coatings and Films Ion Secondary ion mass spectrometry Sputtering Yield (chemistry) Materials Chemistry
Zdroj:	Surface Science. 600:124-132
ISSN:	0039-6028
DOI:	10.1016/j.susc.2005.10.020
Popis:	We have observed secondary particles and photons emitted from hydrogen terminated Si(1 1 1) 1 × 1 surfaces in the interactions with highly charged ions (HCIs) of iodine having a wide range of charge state, q, from I17+ up to I53+, fully stripped iodine ion. A TOF-SIMS (time-of-flight secondary ion mass spectrometry) apparatus has been used to investigate secondary emissions where protons are dominant signals in the TOF spectra. Measured yields of H+ and H 2 + show strong q-dependences, proportional to q3.4 and q5, respectively. For Si+, while the yield remains constant for q
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::a21ad3685f59a2babee6ebb48387b706 https://doi.org/10.1016/j.susc.2005.10.020 Zobrazit plný text záznamu Full Text from ScienceDirect