Precisely THz spectroscopy measurement of a three-layer structure using THz-TDS waveform rebuilding technology
| Autor: | Fenglei Guo, Xiangjun Li, Jian Song |
|---|---|
| Rok vydání: | 2017 |
| Předmět: |
Materials science
business.industry Terahertz radiation 02 engineering and technology Signal Transfer function Sample (graphics) Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Cuvette 020210 optoelectronics & photonics Optics 0202 electrical engineering electronic engineering information engineering Range (statistics) Waveform Time domain Electrical and Electronic Engineering business |
| Zdroj: | Optik. 131:769-774 |
| ISSN: | 0030-4026 |
| DOI: | 10.1016/j.ijleo.2016.11.210 |
| Popis: | We extracted optical material parameter of a middle sample layer in a three-layer structure from THz time-domain transmission spectroscopy by waveform rebuilding technology. The sample waveform is rebuilt by a reference signal in air and the transfer function of three-layer structure with liquid as a sample. Material parameters were calculated by minimizing the difference between the measured sample waveform and a rebuilt one in time domain. The method has wide application in the investigation of liquids in a known-thickness cuvette with high absorption in THz range. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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