Test Structure to Extract Circuit Models of Nanostructures Operating at High Frequencies

Autor:	Shoba Krishnan, Francisco Madriz, Xuhui Sun, John R. Jameson, Cary Y. Yang
Rok vydání:	2009
Předmět:	Frequency response Nanostructure Materials science business.industry Carbon nanotube Capacitance law.invention Transmission (telecommunications) Nanoelectronics law Scattering parameters Electronic engineering Optoelectronics RC circuit business
Zdroj:	2009 IEEE International Conference on Microelectronic Test Structures.
Popis:	We describe a test structure optimized for studying high-frequency electrical transport in 1-D nanoscale systems. The test structure exhibits lower transmission than previously reported structures, enabling capacitances less than 1 fF to be detected in the frequency response of the nanoscale system. The scattering parameters (S-parameters) of the test structure are describable to within ±0.5dB and ±2° from 0.1 to 50 GHz using a simple lumped-element RC circuit model whose elements are all measured experimentally.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::a1d480b37dc51025cab9082300177b28 https://doi.org/10.1109/icmts.2009.4814605 Zobrazit plný text záznamu