| Popis: |
An impressive body of theoretical research to model the behavior of bridges exists. We take that a step further and describe an experiment to compute single cycle scan tests for bridges and evaluate them in silicon. Experimental data, on a high volume part, shows that by marginally increasing the static bridge fault coverage of realistic bridges, unique parts missed by a comprehensive set of stuck-at tests were detected. We believe that this is the first silicon data on the value of adding single cycle scan tests for bridges to the manufacturing flow. |
