Determination of nanomaterials’ film thickness using filmetrics F40-UV thin-film analyzer; Standard Operating Procedure Series : Characterization (C)

Autor:	Kathryn. Kremer, Qihau. Wu, Stephen Gibbons
Rok vydání:	2019
Předmět:	Spectrum analyzer Materials science Series (mathematics) business.industry Optoelectronics Thin film Molar absorptivity business Refractive index Reflectivity Characterization (materials science) Nanomaterials
DOI:	10.21079/11681/33627
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::a12a6838bd5af8ff08ba58258d9aefda https://doi.org/10.21079/11681/33627 Zobrazit plný text záznamu