Diagnosis of a soft short and local variations of parameters occurring simultaneously in analog CMOS circuits
| Autor: | Michał Tadeusiewicz, Stanisław Hałgas |
|---|---|
| Rok vydání: | 2017 |
| Předmět: |
Engineering
business.industry 020208 electrical & electronic engineering Local parameter 02 engineering and technology Tracing Condensed Matter Physics Space (mathematics) Fault (power engineering) Atomic and Molecular Physics and Optics 020202 computer hardware & architecture Surfaces Coatings and Films Electronic Optical and Magnetic Materials Nonlinear system Algebraic equation CMOS 0202 electrical engineering electronic engineering information engineering Electronic engineering Electrical and Electronic Engineering Safety Risk Reliability and Quality business Algorithm Electronic circuit |
| Zdroj: | Microelectronics Reliability. 72:90-97 |
| ISSN: | 0026-2714 |
| DOI: | 10.1016/j.microrel.2017.03.025 |
| Popis: | This paper is devoted to fault diagnosis of nonlinear analog CMOS circuits designed in nanometer technology. A method that allows diagnosing a single soft short and local parameter variations, occurring simultaneously, is developed. The method exploits DC measurements at limited number of points in the test phase. The diagnostic test leads to a system of nonlinear algebraic equations, not given in explicit analytical form, that may have multiple solutions. The solutions determine the sets comprising one soft short value and several values of the preliminary selected parameters. To find them an extended simplicial algorithm is developed. It allows tracing different space curves, leading to different solutions. Moreover, a procedure for selecting the actual solution from among the obtained ones is proposed. For illustration a representative numerical example is discussed in detail. |
| Databáze: | OpenAIRE |
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