| Autor: |
A. Gauzzi, Davor Pavuna, B. Johan Joensson, Arnaud Clerc-Dubois |
| Rok vydání: |
1996 |
| Předmět: |
|
| Zdroj: |
Oxide Superconductor Physics and Nano-Engineering II. |
| ISSN: |
0277-786X |
| DOI: |
10.1117/12.250275 |
| Popis: |
We report a combined analysis of resistivity and x-ray diffraction rocking curve measurements on c-axis oriented YBA 2 Cu 3 O 6.9 films epitaxially grown on (100) SrTiO 3 and LaAlO 3 by ion-beam sputtering. We find that the growth-induced reduction of long-range lattice order in the films begins to depress superconductivity and normal conductivity at a critical value of lattice coherence length of approximately equals 10 and 5 nm for the two above types of substrates respectively. Evidence for disorder-induced localization is given by a deviation from linearity of the temperature-dependence of the resistivity which scales as the reduction of superconducting critical temperature. Similar nonlinear dependence observed in slightly reduced or lightly Co-doped samples suggests that the disorder in our films significantly affects the CuO chains. Our analysis of the paraconductivity term in the films gives evidence for the enhancement of the superconducting fluctuations by the disorder. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
|
