Spin-offs of STM - Non-Contact Nanoscale Probes
| Autor: | N. John DiNardo |
|---|---|
| Rok vydání: | 2007 |
| Předmět: |
Conventional transmission electron microscope
Scanning Hall probe microscope Materials science Microscope business.industry Electrochemical scanning tunneling microscope law.invention Scanning probe microscopy law Optoelectronics Electron beam-induced deposition Electron microscope business Environmental scanning electron microscope |
| Zdroj: | Nanoscale Characterization of Surfaces and Interfaces ISBN: 9783527615957 Nanoscale Characterization of Surfaces and Interfaces |
| DOI: | 10.1002/9783527615957.ch5 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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