Electron microscopy analysis of structural changes within white etching areas

Autor:	Joachim Mayer, Alexander Schwedt, Annika Martina Diederichs, T. Dreifert
Rok vydání:	2016
Předmět:	Materials science Mechanical Engineering Significant difference Metallurgy 02 engineering and technology 021001 nanoscience & nanotechnology Condensed Matter Physics Contrast imaging Microstructure Carbide law.invention 020303 mechanical engineering & transports 0203 mechanical engineering Mechanics of Materials Etching (microfabrication) law General Materials Science Electron microscope 0210 nano-technology Dissolution Electron backscatter diffraction
Zdroj:	Materials Science and Technology. 32:1683-1693
ISSN:	1743-2847 0267-0836
Popis:	In the present work, crack networks with white etching areas (WEAs) in cross-sections of bearings were investigated by a complementary use of SEM and TEM with the focus on the use of orientation contrast imaging and electron backscatter diffraction (EBSD). Orientation contrast imaging was used for the first time to give detailed insight into the microstructure of WEA. A significant difference between Nital-etched and polished WEA samples was observed. It was revealed that WEAs are composed of different areas with varying grain sizes. As a result of secondary transformation, needle-shaped grains were observed within WEAs. Using EBSD analysis, evidence was obtained that WEA formation and accompanying crack growth are without relation microstructural features. In addition, an inhomogeneous chemical structure of WEA as a result of carbide dissolution is revealed by analytical investigations.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::a03c89cb1352be596a0967277e958307 https://doi.org/10.1080/02670836.2016.1139030 Zobrazit plný text záznamu Plný text ve formátu PDF Plný text ve formátu HTML
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