The accuracy of diffraction patterns taken in a diamond-anvil cell using an X-ray diffractometer according to the Dobrovol’skii-Shvedov method

Autor:	N. V. Novikov, Yu. N. Krivosheya, L. K. Shvedov
Rok vydání:	2013
Předmět:	Diffraction Materials science business.industry Analytical chemistry A diamond engineering.material Diamond anvil cell Inorganic Chemistry Polycrystalline silicon Optics engineering General Materials Science business Diffractometer
Zdroj:	Journal of Superhard Materials. 35:192-194
ISSN:	1934-9408 1063-4576
DOI:	10.3103/s106345761303009x
Popis:	The accuracy of the diffraction patterns taken on a DRON-3 diffractometer by the Dobrovol’skii-Shvedov method in a diamond-anvil cell has been analyzed. The generally accepted reference materials (polycrystalline silicon and NaCl) have been used as samples. The long-term stability has been checked on a steel sample.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::a00cc6a0cbfa2b13912bba19a2df0595 https://doi.org/10.3103/s106345761303009x Zobrazit plný text záznamu Full text from SpringerLink