Analyzing the reliability for Life Evaluation of Cables According to Accelerated Degradation Test
| Autor: | Ji-Yeon Lee, Jae-Ho Kim, Jin-Dong Jeong, Sin-Dong Kang |
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| Rok vydání: | 2020 |
| Předmět: | |
| Zdroj: | Journal of the Korean Institute of Illuminating and Electrical Installation Engineers. 34:16-22 |
| ISSN: | 2287-5034 1229-4691 |
| Popis: | This paper comparatively analyzed the characteristics of the insulation resistance of TFR-8(Tray Frame Retardant power cable for fire service) cables according to accelerated degradation temperature and thermal stress application methods to ensure the validity of the accelerated degradation life test using the Arrhenius model. The study derived accelerated degradation times according to accelerated degradation temperatures by applying the Arrhenius model, and it manufactured cable specimens with equivalent lifetimes of 10, 20, 30, and 40 years using a forced-convection oven. The insulation resistance decreased as the temperature increased, and the measured insulation resistance of equivalent-lifetime cables were similar. The experimental results of constant thermal stress and step-stress application methods were also similar. These results verify the validity of the correlation between the Arrhenius model’s temperature and the chemical reaction rate. However, the accelerated degradation time could vary according to the calculation method of activation energy, which requires follow-up studies. |
| Databáze: | OpenAIRE |
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