ChemInform Abstract: Anodic Niobium Pentoxide Films: Growth and Thickness Determination by in situ Optoelectrochemical Measurements

Autor:	N. L. Dias, J. F. Julião, J. W. R. Chagas, H. L. Cesar, U. U. Gomes, Franco Decker
Rok vydání:	2010
Předmět:	In situ Anodizing Niobium Analytical chemistry chemistry.chemical_element General Medicine Anode Metal chemistry.chemical_compound chemistry Anodization voltage visual_art visual_art.visual_art_medium Niobium pentoxide Optical reflectance
Zdroj:	ChemInform. 22
ISSN:	0931-7597
DOI:	10.1002/chin.199138018
Popis:	Data on optical reflectance and anodization voltage, obtained during the galvanostatic anodization of metallic niobium foils in an H3PO4 (1%) solution at room temperature were simultaneously recorded as a function of time, to determine the thickness of the Nb2O5 films formed. From these data, plots of film thickness vs anodization voltage were obtained. A linear relation was always observed and in all cases but one, an angular coefficient of 22 A V−1 was verified.
Databáze:	OpenAIRE
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