A Built-in Spice Time-domain Variation Model of the BTI-induced Random Trap Fluctuation (RTF) in 14 nm FinFETs
| Autor: | L. C. Lin, Z. Y. Wang, M. Y. Lee, J. K. Chang, E. R. Hsieh, J. C. Guo, Steve S. Chung |
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| Rok vydání: | 2022 |
| Zdroj: | 2022 IEEE Silicon Nanoelectronics Workshop (SNW). |
| DOI: | 10.1109/snw56633.2022.9889071 |
| Databáze: | OpenAIRE |
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