Soft Error Issues with Scaling Technologies

Autor:	Sanghyeon Baeg, Soonyoung Lee, Jongsun Bae, Hyeonwoo Nam, Sang Hoon Jeon, Chulseung Lim
Rok vydání:	2012
Předmět:	Engineering Hardware_MEMORYSTRUCTURES business.industry Reliability (computer networking) Transistor Hardware_PERFORMANCEANDRELIABILITY Interval (mathematics) Upset law.invention Soft error Single event upset law Electronic engineering Spurious relationship business Scaling
Zdroj:	Asian Test Symposium
Popis:	As transistor geometry shrinks, the erroneous and spurious charge from a particle strike tends to be shared by multiple nodes and causes multiple nodes upset. Such SEU mechanism invalidates the hardening principle of protecting a single node in relatively larger technologies. SEU needs to be accordingly understood and evaluated. In an 28-nm design example, SEU can happen in 6-day interval if no mitigation technique is used.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9f98fa3bff744fd5b24bda06dd9a883d https://doi.org/10.1109/ats.2012.72 Zobrazit plný text záznamu