Laser tests of silicon detectors
| Autor: | Sergio Iniesta González, G.F. Moorhead, Radan Slavík, Salvador Marti, Philip Phillips, Petr Kubík, Szymon Gadomski, Z. Doležal, P. Řezníček, Carmen García, Peter Kodys, Carlos Lacasta, C. Escobar, Vasiliki A Mitsou |
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| Rok vydání: | 2007 |
| Předmět: |
Physics
Nuclear and High Energy Physics Pixel Silicon Physics::Instrumentation and Detectors business.industry Detector Physics::Optics chemistry.chemical_element Laser law.invention Semiconductor laser theory Semiconductor detector chemistry law Optoelectronics Physics::Atomic Physics business Instrumentation Diode |
| Zdroj: | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 573:12-15 |
| ISSN: | 0168-9002 |
| DOI: | 10.1016/j.nima.2006.10.319 |
| Popis: | This paper collects experiences from the development of a silicon sensor laser testing setup and from tests of silicon strip modules (ATLAS End-cap SCT), pixel modules (DEPFET) and large-area diodes using semiconductor lasers. Lasers of 1060 and 680 nm wavelengths were used. A sophisticated method of focusing the laser was developed. Timing and interstrip properties of modules were measured. Analysis of optical effects involved and detailed discussion about the usability of laser testing for particle detectors are presented. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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