Macro model for stochastic behavior of resistance distribution of magnetic tunnel junction

Autor:	Jun-Tae Choi, Gyu-Hyun Kil, Yun-Heub Song
Rok vydání:	2015
Předmět:	Work (thermodynamics) Tunnel magnetoresistance Materials science Distribution (mathematics) Physics and Astronomy (miscellaneous) Stochastic behavior Circuit performance General Engineering General Physics and Astronomy Biasing Mechanics Macro
Zdroj:	Japanese Journal of Applied Physics. 54:04DD12
ISSN:	1347-4065 0021-4922
DOI:	10.7567/jjap.54.04dd12
Popis:	In this work, we fabricated MgO-based magnetic tunnel junction (MTJ) samples to observe behavior of resistance variation, and investigated a stochastic behavior model for MTJ resistance from measured real data. We found the relationship between parallel resistance (RP), anti-parallel resistance (RAP), and TMR from the measurements. The variation of barrier thickness affects not only resistance but also TMR. This means that broad RAP distribution is caused by RP distribution. In addition, RAP distribution can be reduced by increasing temperature and bias voltage. We developed a macro model that can evaluate resistance distribution based on the stochastic behavior of MTJ resistance variation from only tox varied. The amount of resistance variation, which is considered with regard to the circuit performance, can be obtained from Δtox designed by designer. In addition, the impact for operating circumstance such as bias and temperature can be considered by using fit equations.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9f736d79c399b5ddb273e911320069d1 https://doi.org/10.7567/jjap.54.04dd12 Zobrazit plný text záznamu