Design Challenges and Solutions of Emerging Nonvolatile Memory for Embedded Applications

Autor:	Yu-Der Chih, Chung-Cheng Chou, Yi-Chun Shih, Chia-Fu Lee, Win-San Khwa, Chun-Yu Wu, Kuei-Hung Shen, Wen-Ting Chu, Meng-Fan Chang, Harry Chuang, Tsung-Yung Jonathan Chang
Rok vydání:	2021
Zdroj:	2021 IEEE International Electron Devices Meeting (IEDM).
DOI:	10.1109/iedm19574.2021.9720557
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9f4db78e784b4732bff64cc52ffe7309 https://doi.org/10.1109/iedm19574.2021.9720557 Zobrazit plný text záznamu