Experimental determination of the Young's modulus of various electronic packaging materials

Autor: K. Meier, R. Metasch, F. Kraemer, Steffen Wiese, J. Al Ahmar, Mike Roellig
Rok vydání: 2017
Předmět:
Zdroj: 2017 18th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).
DOI: 10.1109/eurosime.2017.7926239
Popis: The paper presents details about the adequate experimental determination of the Young's modulus on miniaturized specimens for material used in electronic packaging. The difficulty to determine accurately the Young's modulus is caused by the requirements of representative specimens for the area of electronic packaging. In many cases such specimens, e.g. solder balls, are connected with the issues of inhomogeneous stress distributions, small dimensions, or special gripping requirements, that create a number of challenges to conduct mechanical experiments. In addition there are problems that arise from the nonlinearities in the constitutive behaviour of the material to be characterized, such as creep deformation. Therefore any attempt to accurately determine the Young's modulus needs a case to case consideration of the specific issues for the given specimen and material.
Databáze: OpenAIRE