Theoretical characterization of reflector-assisted TXRF analysis

Autor:	Andriy Okhrimovskyy, Kouichi Tsuji, Kesami Saito
Rok vydání:	2006
Předmět:	Materials science business.industry Experimental data Bioengineering Reflector (antenna) Surfaces and Interfaces Condensed Matter Physics Surfaces Coatings and Films Characterization (materials science) Optics Mechanics of Materials business Intensity (heat transfer) Beam (structure) Biotechnology
Zdroj:	e-Journal of Surface Science and Nanotechnology. 4:579-583
ISSN:	1348-0391
DOI:	10.1380/ejssnt.2006.579
Popis:	The intensity enhancement phenomenon in reflector assisted TXRF has been investigated theoretically. Intensity enhancement effect was presented by focusing of primary and reflected X-ray beam to the sample. Proposed explanation behavior was compared with experimental results. Theoretical calculations are in a good qualitative agreement with experimental data. Based on proposed approach, the incident angle of primary X-rays can be evaluated in the experiment. [DOI: 10.1380/ejssnt.2006.579]
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9ec645dc2d3d6a7ff478321127531455 https://doi.org/10.1380/ejssnt.2006.579 Zobrazit plný text záznamu