Analysis of Heavy-Ion-Induced Leakage Current in SiC Power Devices

Autor:	Robert A. Johnson, Arthur F. Witulski, Dennis R. Ball, Kenneth F. Galloway, Andrew L. Sternberg, Robert A. Reed, Ronald D. Schrimpf, Michael L. Alles, Jean-Marie Lauenstein, John M. Hutson
Rok vydání:	2022
Předmět:	Nuclear and High Energy Physics Nuclear Energy and Engineering Electrical and Electronic Engineering
Zdroj:	IEEE Transactions on Nuclear Science. 69:248-253
ISSN:	1558-1578 0018-9499
DOI:	10.1109/tns.2021.3136806
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9ea44ff04aced7b743ee8deef1472acb https://doi.org/10.1109/tns.2021.3136806 Zobrazit plný text záznamu