Reliability assessment of hafnia-based ferroelectric devices and arrays for memory and AI applications (Invited)

Autor:	L. Grenouillet, J. Barbot, J. Laguerre, S. Martin, C. Carabasse, M. Louro, M. Bedjaoui, S. Minoret, S. Kerdilès, C. Boixaderas, T. Magis, C. Jahan, F. Andrieu, J. Coignus
Rok vydání:	2023
Zdroj:	2023 IEEE International Reliability Physics Symposium (IRPS).
DOI:	10.1109/irps48203.2023.10118099
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9e8e0a386fa50f81c95c4bc7797351fd https://doi.org/10.1109/irps48203.2023.10118099 Zobrazit plný text záznamu