In-Situ Raman Monitoring Of UO[sub 2]∕H[sub 2]O Interfaces Under He[sup 2+] Irradiation

Autor:	A. Canizares, G. Guimbretière, Y. A. Tobon-Correa, N. Raimboux, M. Perdicakis, B. Muzeau, M. S. Alam, M. F. Barthe, C. Corbel, P. Simon, P. M. Champion, L. D. Ziegler
Rok vydání:	2010
Předmět:	In situ Materials science Scanning electron microscope Uranium dioxide Analytical chemistry Ion symbols.namesake chemistry.chemical_compound chemistry Radiolysis symbols Irradiation Raman spectroscopy Raman scattering Nuclear chemistry
Zdroj:	AIP Conference Proceedings.
ISSN:	0094-243X
DOI:	10.1063/1.3482814
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9e8d44ced042147d8db287a697cf9a46 https://doi.org/10.1063/1.3482814 Zobrazit plný text záznamu