Investigations on the topographical asymmetry of non-contact atomic force microscopy images of NiO(001) surface observed with a ferromagnetic tip
| Autor: | Hirotaka Hosoi, Koichi Mukasa, Kazuhisa Sueoka |
|---|---|
| Rok vydání: | 2004 |
| Předmět: |
Surface (mathematics)
Materials science Condensed matter physics Mechanical Engineering media_common.quotation_subject Non-blocking I/O Bioengineering General Chemistry Asymmetry Amplitude Nuclear magnetic resonance Ferromagnetism Mechanics of Materials Computer Science::Computer Vision and Pattern Recognition Condensed Matter::Strongly Correlated Electrons General Materials Science Electrical and Electronic Engineering Non-contact atomic force microscopy media_common |
| Zdroj: | Nanotechnology. 15:505-509 |
| ISSN: | 1361-6528 0957-4484 |
| DOI: | 10.1088/0957-4484/15/5/018 |
| Popis: | We investigated atomically resolved NC-AFM images of NiO(001) surfaces obtained with ferromagnetic Fe- and Ni-coated tips and bare Si tips. The cross-sections of atomically resolved images were analysed by adding the atomic corrugation amplitude on the basis of the periodicity of the image. The topographical asymmetry is defined as an index representing the difference of the adjacent maxima. We compare the topographical asymmetry calculated from the images obtained with ferromagnetic metal- and non-coated Si tips and discuss the possible origin of the asymmetry of NC-AFM images. |
| Databáze: | OpenAIRE |
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