Effect of X-rays on the surface composition of polyphosphazene: X-ray photoelectron spectroscopic study
Autor: | D. R. Tur, Alexander V. Naumkin, I. O. Volkov |
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Rok vydání: | 2009 |
Předmět: | |
Zdroj: | Polymer Science Series A. 51:537-541 |
ISSN: | 1555-6107 0965-545X |
DOI: | 10.1134/s0965545x09050071 |
Popis: | X-ray photoelectron spectroscopy has been employed for in situ investigation of the effect of MgK α X-rays with an energy of characteristic irradiation of 1253.6 eV on the composition of the surface of poly[bis(trifluoroethoxy)phosphazene]. An X-ray source is applied to simultaneously irradiate the surface and to generate photoelectrons. An increase in irradiation time and X-ray source power leads to a change in the surface elemental composition and causes the appearance of new states of carbon and nitrogen atoms. |
Databáze: | OpenAIRE |
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