Nanotomography with enhanced resolution using bimodal atomic force microscopy

Autor:	Christian Riesch, Christian Dietz, Alexander M. Gigler, Mario Zerson, Robert Magerle, Robert W. Stark, Nicolaus Rehse
Rok vydání:	2008
Předmět:	Crystallinity Materials science Cantilever Physics and Astronomy (miscellaneous) Flexural strength Etching (microfabrication) Resolution (electron density) Analytical chemistry Conductive atomic force microscopy Image resolution Amorphous solid
Zdroj:	Applied Physics Letters. 92:143107
ISSN:	1077-3118 0003-6951
DOI:	10.1063/1.2907500
Popis:	High resolution volume images of semicrystalline polypropylene were obtained by stepwise wet-chemical etching followed by atomic force microscopy of the specimen. Enhanced signal-to-noise ratio and spatial resolution were achieved by using the second flexural eigenmode of the cantilever for phase imaging while the amplitude of the first mode was used as feedback signal. The energy dissipated between the tip and the sample revealed characteristic differences between the crystalline and the amorphous regions of the polypropylene after etching, indicating the presence of a thin ( < 10 nm thick) amorphous layer on top of crystalline regions.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9e32b2ba370f0102eef4d75596194d3b https://doi.org/10.1063/1.2907500 Zobrazit plný text záznamu