Compendium of Current Single Event Effects Results for Candidate Spacecraft Electronics for NASA

Autor:	Paul W. Marshall, James Forney, C. Poivey, Dave Petrick, S.R. Cox, Ray Ladbury, S.P. Buchner, D.K. Hawkins, Mark P. Baze, Anthony Dung-phan, Martin A. Carts, Martha V. O'Bryan, S.D. Kniffin, Christina Seidleck, Jeremy Karsh, A.B. Sanders, Kenneth A. LaBel, Cheryl J. Marshall, Melanie D. Berg, J.W. Howard, Hak Kim, Ryan Flanigan, M. Friendlich, T.R. Oldham, Wes Powell, T.L. Irwin
Rok vydání:	2007
Předmět:	Engineering business.industry Event (computing) fungi Electrical engineering Semiconductor device Avionics Astrionics Single event upset Performance prediction Nuclear Experiment business Radiation hardening Electronic circuit
Zdroj:	2007 IEEE Radiation Effects Data Workshop.
Popis:	Susceptibility of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is studied. Devices tested include digital, linear bipolar, and hybrid devices.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9e2f1ee628870278c3efa00c683b8b39 https://doi.org/10.1109/redw.2007.4342557 Zobrazit plný text záznamu