High mass resolution SIMS
| Autor: | Sean P. Maharrey, Robert Bastasz, J. Whaley, S. Hoffer, G. Kruppa, Richard Behrens, Aaron M. Highley |
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| Rok vydání: | 2004 |
| Předmět: |
Resolution (mass spectrometry)
Chemistry Analytical chemistry General Physics and Astronomy Surfaces and Interfaces General Chemistry Condensed Matter Physics Mass spectrometry Fourier transform ion cyclotron resonance Ion source Surfaces Coatings and Films law.invention Ion Secondary ion mass spectrometry Reflectron law Ion cyclotron resonance |
| Zdroj: | Applied Surface Science. :972-975 |
| ISSN: | 0169-4332 |
| DOI: | 10.1016/j.apsusc.2004.03.197 |
| Popis: | We are developing a method to conduct SIMS analysis at high mass resolution (m/Δm>50,000), to facilitate the examination and study of complex organic and biomolecules on surfaces. The approach uses a primary-ion beam probe (rastered 25 keV Ga+ ion source), providing high (100 nm) spatial resolution, and an ion cyclotron resonance (ICR) cell, capable of mass analysis at a resolution in excess of 105 and mass accuracy of less than 1.0 ppm. The apparatus includes a time-of-flight (ToF) mass analyzer, offering rapid chemical mapping at low (m/Δm 300), although, readily detected by the ToF analyzer, are inefficiently transmitted to the ICR cell. This has stimulated the design of a new ion optics coupling arrangement, which provides a higher mass resolution over a wider mass range. |
| Databáze: | OpenAIRE |
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