Effects of temperature on structural and morphological features of CoPc and CoPcF16 thin films
| Autor: | B.-E. Schuster, Vladimir Plyashkevich, Tamara V. Basova, Thomas Chassé, Heiko Peisert |
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| Rok vydání: | 2010 |
| Předmět: |
Absorption spectroscopy
Metals and Alloys Analytical chemistry chemistry.chemical_element Surfaces and Interfaces Substrate (electronics) Surfaces Coatings and Films Electronic Optical and Magnetic Materials chemistry.chemical_compound Crystallinity symbols.namesake chemistry Chemical engineering X-ray crystallography Materials Chemistry Phthalocyanine symbols Thin film Raman spectroscopy Cobalt |
| Zdroj: | Thin Solid Films. 518:7161-7166 |
| ISSN: | 0040-6090 |
| DOI: | 10.1016/j.tsf.2010.06.030 |
| Popis: | Herein investigation of the effects of substrate temperature on the structural and morphological features of both cobalt(II) phthalocyanine (CoPc) and cobalt(II) hexadecafluorophthalocyanine (CoPcF 16 ) thin films is presented. For these purposes thin films of CoPc and CoPcF 16 prepared by organic molecular beam deposition were investigated by means of optical absorption spectroscopy, X-ray diffraction, Raman spectroscopy, and atomic force microscopy. Concerning the degree of crystallinity, the morphology, the phase composition and the preferential molecular orientation of both CoPc and CoPcF 16 thin films, we found out that the increase of substrate temperature during growth influences these properties of the above-mentioned thin film systems (CoPc vs. CoPcF 16 ) in a different way. |
| Databáze: | OpenAIRE |
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