Phénomènes de diffraction produits par les systèmes stratifiés à distribution d'atomes partiellement différente de couche à couche

Autor:	G. Besson, C. Tchoubar, J. Mering
Rok vydání:	1974
Předmět:	Crystallography Electron diffraction Chemistry Illite engineering Lamellar structure engineering.material Layer (electronics) General Biochemistry Genetics and Molecular Biology
Zdroj:	Journal of Applied Crystallography. 7:345-350
ISSN:	0021-8898
DOI:	10.1107/s0021889874009782
Popis:	Order–disorder relations have been studied by electron diffraction in a lamellar system consisting of stacked layers in which some atoms are partially disordered. The analysis of a single reciprocal-space section permits the derivation of the defect distribution in a layer as a whole if there is no correlation between the distribution of defects in different layers. The method is applied to the study of isomorphic substitutions in microcrystallized layer silicates such as beidellite and illite.
Databáze:	OpenAIRE
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