THz to Inspect Graphene and Thin Film Materials
| Autor: | David Etayo, A. G. Miguel Laso, Cristián Caamaño Martinez, Andrea Inés, Israel Arnedo, Luis Miranda, Albert Redo-Sanchez, Alvaro Cordon, Montserrat Recalde Fernández, Elena Taboada, M. Castrillo, Pablo Rodriguez |
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| Rok vydání: | 2019 |
| Předmět: |
Materials science
Fabrication business.industry Graphene Terahertz radiation 02 engineering and technology Conductivity 021001 nanoscience & nanotechnology 01 natural sciences law.invention Characterization (materials science) 010309 optics symbols.namesake Reflection (mathematics) law 0103 physical sciences symbols Optoelectronics Thin film 0210 nano-technology business Raman scattering |
| Zdroj: | 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz). |
| DOI: | 10.1109/irmmw-thz.2019.8874447 |
| Popis: | In this paper, we present a system that provides meso-scale characterization of thin film materials, covering the gap between nano-scale and macro-scale methods. Nano-scale methods are slow and cannot characterize large surfaces. Macroscale methods generate characterization that averages the magnitudes and, thus, cannot provide localized information. Our system works in reflection as opposed to state-of-the-art methods and provides mobility, carrier density, and conductance maps in the THz range. Moreover, it can be integrated with reactors and enables monitoring of the fabrication of materials in real-time, supporting, for instance, the production of graphene at industrial scale. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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