Studies of Misfit Dislocation Densities in II-VI Laser Structures by Diffuse X-Ray Scattering

Autor:	Detlef Hommel, M. Klude, Gabriela Alexe, V. Kaganer, H. Heinke
Rok vydání:	2002
Předmět:	Diffraction Materials science Scattering business.industry Doping Condensed Matter Physics Laser Cladding (fiber optics) Molecular physics Electronic Optical and Magnetic Materials Semiconductor laser theory law.invention Reciprocal lattice Optics law Dislocation business
Zdroj:	physica status solidi (b). 229:193-196
ISSN:	1521-3951 0370-1972
Popis:	ZnSe-based laser structures grown on GaAs(001) substrates were studied by high resolution X-ray diffraction. Extended diffuse scattering observed in reciprocal space maps was found to be caused by misfit dislocations located at the interface between the p-type doped ZnSSe spacer on top of the p-type cladding layer and the subsequent ZnSe layer. Linear densities of dislocations are estimated by simulations.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9ddf95c9188e1e453248c585ae605e79 https://doi.org/10.1002/1521-3951(200201)229:1<193::aid-pssb193>3.0.co Zobrazit plný text záznamu Plný text