Long-Term Aging and Failure Analysis for 980 nm Laser Diodes

Autor:	刘媛媛 Liu Yuanyuan, 刘斌 Liu Bin, 崔碧峰 Cui Bifeng
Rok vydání:	2012
Předmět:	Materials science business.industry law Optoelectronics Electrical and Electronic Engineering business Laser Atomic and Molecular Physics and Optics Term (time) Diode law.invention
Zdroj:	Laser & Optoelectronics Progress. 49:091404
ISSN:	1006-4125
DOI:	10.3788/lop49.091404
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9db10df7c939a813e06ecf4fe7b65229 https://doi.org/10.3788/lop49.091404 Zobrazit plný text záznamu