Sputtering Yields of Gold Nanoparticles by C60 Ions

Autor:	Martin P. Seah, J. L. S. Lee, Ian S. Gilmore, Emily H. Anstis, Li Yang
Rok vydání:	2012
Předmět:	Materials science Scanning electron microscope Analytical chemistry Nanoparticle Substrate (electronics) Surfaces Coatings and Films Electronic Optical and Magnetic Materials Ion Secondary ion mass spectrometry General Energy Sputtering Colloidal gold Wafer Physical and Theoretical Chemistry
Zdroj:	The Journal of Physical Chemistry C. 116:9311-9318
ISSN:	1932-7455 1932-7447
Popis:	The sputtering yields of nanoparticles are expected to be higher than those for traditional flat films because of the higher surface area and lower volume to dissipate the primary ion energy. In the present study, gold nanoparticles in the size range 10 to 100 nm, dispersed on a silicon wafer, are studied by secondary ion mass spectrometry (SIMS) during sputtering by 20 keV C60++ and by scanning electron microscopy. It is shown that early in the profile the particles melt and then resolidify. This is not mitigated by sample cooling. Profiling nanoparticles by SIMS may be very difficult without adequate heat sinking. The ways that the nanoparticle and substrate secondary ion intensities change during the profiling in a two-beam SIMS system are not simple to interpret, and so this situation is modeled in some detail. It is shown that the sputtering yield for primary ions on the axis of the nanoparticle, Y(0°), can be extracted from the data. For the first time, we measure a significant increase in this sput...
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9d07e6ee7c1e0e9e343d4ba7e852bdc7 https://doi.org/10.1021/jp300900j Zobrazit plný text záznamu