Modeling of Al_2O_3 Thin Film Growth in Modern Ion Coating Processes
Autor: | Detlev Ristau, Karsten Heinrich, Henrik Ehlers, Marcus Turowski |
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Rok vydání: | 2013 |
Předmět: | |
Zdroj: | Optical Interference Coatings. |
Popis: | Classical molecular dynamics techniques are used for modeling Al2O3 thin film growth according to modern ion coating processes. Results for surface roughness and film density dependent on deposition energy are presented. |
Databáze: | OpenAIRE |
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