| Autor: |
Dirk Nussler, Stefan Kose, Ralf Brauns, Nils Pohl, Sven Heinen |
| Rok vydání: |
2015 |
| Předmět: |
|
| Zdroj: |
2015 European Microwave Conference (EuMC). |
| DOI: |
10.1109/eumc.2015.7345795 |
| Popis: |
Millimeter wave imaging technologies offer a wide spectrum of new applications. Research results of the last year's show, that millimeter waves can be used to detect letter bombs and non-metallic impurities inside products or can be used to control material parameters in real-time applications to detect fluctuations during the production. The main challenge for an operational system is the development of fast and cheap scanner concepts for this frequency range |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
|
