Combining Atomic Force Microscopy with Polarized Raman Microscopy
| Autor: | Juergen Sawatzki, Carsten Wehlack, Wulff Possart, Andrea Thoene, Matthias Hannss, Ralph Schlipper, Tim Rider, P. M. Champion, L. D. Ziegler |
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| Rok vydání: | 2010 |
| Předmět: |
Kelvin probe force microscope
Materials science business.industry Scanning confocal electron microscopy Analytical chemistry Conductive atomic force microscopy Scanning capacitance microscopy law.invention Optical microscope law Microscopy Scanning ion-conductance microscopy Optoelectronics business Photoconductive atomic force microscopy |
| Zdroj: | AIP Conference Proceedings. |
| ISSN: | 0094-243X |
| DOI: | 10.1063/1.3482820 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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